Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
商品#: 62774953

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

商品#: 62774953

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この商品の利点

Comprehensive Overview
This edition provides an extensive introduction to both basic modes and advanced applications of Atomic Force Microscopy, catering to beginners and experienced users alike.
Practical Insights
Featuring real-world applications, the book offers practical insights and methodologies that address common challenges in microscopy, enhancing the reader’s ability to apply knowledge effectively.
Expert Contributions
Written by leading experts in the field, it ensures the latest research and diverse perspectives, making it an invaluable resource for academics and professionals pursuing advanced studies.

製品詳細

Shop Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications online at a best price in 日本. 0470638826
Publisher Wiley
Publication date September 24, 2012
Edition 1st
Language English
Print length 496 pages
ISBN-10 0470638826
ISBN-13 978-0470638828
Item Weight 1.87 pounds (850 grams)
Dimensions 6.42 x 1.22 x 9.6 inches (16.3 x 3.1 x 24.4 cm)

どんな人にお勧めですか?

Suitable For
  • Students in Science

    Ideal for students studying nanotechnology or materials science who require foundational knowledge of atomic force microscopy techniques.

  • Researchers in Academia

    Beneficial for researchers exploring surface characterization methods, providing insights into advanced applications of atomic force microscopy.

  • Laboratory Technicians

    Useful for lab technicians implementing atomic force microscopy in practical settings, enhancing their understanding of operational modes.

Not Suitable For
  • Casual Readers

    Not suitable for casual readers lacking a scientific background, as the content is highly technical and specialized.

製品説明書

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

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Microscopes & Microsocopy Editorial Review

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications offers a comprehensive dive into the techniques used in atomic force microscopy with a focus on both foundational methods and sophisticated applications. With its detailed 496 pages, the book published by Wiley serves as a vital resource for both newcomers and experienced practitioners. Readers will appreciate the author’s clarity in explaining complex concepts, making it accessible to a wide audience. The informative content is backed by the latest research, ensuring a well-rounded understanding of microscopy techniques. This edition's robustness in layout and design complements its educational value, making it a must-have for anyone in the field.

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長所

  • Comprehensive coverage of atomic force microscopy techniques
  • Well-structured for both beginners and advanced users
  • Clear explanations of complex concepts and methods
  • Latest research integrated into the text
  • Durable edition with high-quality print

短所

  • Might be dense for casual readers without a background

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